Defect analysis in electron microscopy / (Registro n. 5092)

Detalhes MARC
000 -LEADER
fixed length control field 00990pam a2200313 i 4500
001 - CONTROL NUMBER
control field 5092
003 - CONTROL NUMBER IDENTIFIER
control field BR-MnINPA
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250319193521.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 750728s1975 nyua b 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 75025615
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0412137607.
-- 0412137704
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Transcribing agency DLC
Modifying agency DLC
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QD921
Item number .L67
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 548.84
Edition information 19
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) 548.84
Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN) L869
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Loretto, M. H.
245 10 - TITLE STATEMENT
Title Defect analysis in electron microscopy /
Statement of responsibility, etc. M. H. Loretto and R. E. Smallman.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. London :
Name of publisher, distributor, etc. Chapman and Hall ;
Place of publication, distribution, etc. New York :
Name of publisher, distributor, etc. Wiley : distributed by Halstead Press,
Date of publication, distribution, etc. c1975.
300 ## - PHYSICAL DESCRIPTION
Extent ix, 134 p. :
Other physical details ill. ;
Dimensions 24 cm.
500 ## - GENERAL NOTE
General note "A Halsted Press book."
500 ## - GENERAL NOTE
General note Includes index.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Crystals
General subdivision Defects.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Cristais
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electron microscopy.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Smallman, R. E.,
Relator term joint author.
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c orignew
d 1
e ocip
f 19
g y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Livro
901 ## - LOCAL DATA ELEMENT A, LDA (RLIN)
a https://catalogo.inpa.gov.br/img/e47/p05/6.jpg
Exemplares
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Total checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification     Obras Gerais Biblioteca do INPA Biblioteca do INPA E47_P05 03/19/2025   548.84 L869 76-2320 03/14/2017 03/14/2017 Livro