Defect analysis in electron microscopy /

Loretto, M. H.

Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman. - London : New York : Chapman and Hall ; Wiley : distributed by Halstead Press, c1975. - ix, 134 p. : ill. ; 24 cm.

"A Halsted Press book." Includes index.

0412137607. 0412137704

75025615


Crystals--Defects.
Cristais
Electron microscopy.

QD921 / .L67

548.84