TY  - BOOK
AU  - Loretto,M.H.
AU  - Smallman,R.E.
TI  - Defect analysis in electron microscopy
SN  - 0412137607.
AV  - QD921 .L67
U1  - 548.84 19
PY  - 1975///
CY  - London, New York
PB  - Chapman and Hall, Wiley : distributed by Halstead Press
KW  - Crystals
KW  - Defects
KW  - Cristais
KW  - Electron microscopy
N1  - "A Halsted Press book."; Includes index
ER  -