Loretto, M. H. <br/><br/>
Defect analysis in electron microscopy / 
M. H. Loretto and R. E. Smallman. 
 - London :  New York :  Chapman and Hall ;  Wiley : distributed by Halstead Press,  c1975. 
 - ix, 134 p. :  ill. ;  24 cm. 
<br/><br/> "A Halsted Press book."  Includes index. 
<br/><br/><label>ISBN: </label>0412137607.  0412137704 
<br/><br/><label>LCCN: </label>75025615  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystals--Defects.<br/>Cristais<br/>Electron microscopy.
<br/><br/><label>LC Class. No.: </label>QD921  / .L67 
<br/><br/><label>Dewey Class. No.: </label>548.84